AMSEC's Advisory Committee establishes our bylaws. To find out more about the Advisory Committe visit the Advisory Committee page.
AMSEC Bylaws- November 2007
Bylaw Amendment- April 2009
AMSEC is continuously evaluating itself to measure the center's performance. To view AMSEC's complete Assessment Plan visit our Assessment page.
AMSEC offers a wide range of state-of-the-art materials synthesis, processing, and characterization resources available to university researchers and to companies in need of specialized equipment or expertise. AMSEC provides some resources through its own Materials Characterization Facility, with additional equipment and capabilities available through affiliated faculty and departments.
If you are a company, AMSEC will assist you in accessing technical resources, advice from faculty experts, and specialized equipment in a timely and responsive manner. Companies should contact the Department Manager, Juliet.Barnes@wwu.edu or refer to the For Industry page.
Usage Policy and Fees
All equipment in AMSEC's Materials Characterization Facility as well as most equipment in the research labs and departments of its affiliated faculty is made available at no charge to members of the Western community. For information on student training, scheduling and usage policy, email Kyle.Mikkelsen@wwu.edu.
AMSEC has server space available for AMSEC faculty research groups and for classes that use AMSEC equipment. If you are interested in using the server for research or classes, email Kyle.Mikkelsen@wwu.edu to request access. Users with access permission can connect to the server from computers on the WWU campus, see the instructions for use by clicking here.
ASMEC Instrument Reservations
To make an instrument reservation click Reservations.
Fees vary according to the duration and scope of the project, level of involvement of staff, and type of equipment. Contact us for information about particular instrumentation.
- Chemical Analysis
- Thermal, Mechanical, Structural & Analysis
- Polymer Processing & Analysis
- Thin Film Preparation & Characterization