Microscopy
| SEM | Vega TS-5163MM with EDX |
| Atomic Force Microscope | DI Nanoscope III |
| Scanning Tunneling Microscope | RHK |
| Optical Microscopy | Polarizing Optical Microscope |
| FT-IR Microscopy | Nicolet Continuum |
- Chemical Analysis
- Thermal, Mechanical, Structural & Analysis
- Polymer Processing & Analysis
- Thin Film Preparation & Characterization
Page Updated
02.02.2011
