Microscopy
| SEM | Vega TS-5163MM with EDX | Dr. Devon Cancilla | 650-7785 | |
| Atomic Force Microscope | DI Nanoscope III | Dr. David Patrick | 650-3128 | |
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Scanning Tunneling Microscope | RHK | Dr. David Patrick | 650-3128 |
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Optical Microscopy | Polarizing Optical Microscope | Dr. David Patrick | 650-3128 |
| FT-IR Microscopy | Nicolet Continuum | Dr. David Patrick | 650-3128 |
- Chemical Analysis
- Thermal, Mechanical, Structural & Analysis
- Polymer Processing & Analysis
- Thin Film Preparation & Characterization
Page Updated
10.26.2007

